OUP: UK General Catalogue

NEVER MISS AN OXFORD SALE (SIGN UP HERE) |

VIEW BASKET

UK and Europe

Book Catalogue

	Help with online ordering
	How to order
	Postage
	Returns policy
	Search the catalogue
	VAT rates

	Authors
	Description
	Reviews
	Table of Contents

Defect and Microstructure Analysis by Diffraction

Robert L. Snyder, Jaroslav Fiala, and Hans J. Bunge

Price: £145.00 (hardback)
ISBN-13: 978-0-19-850189-3
Publication date: 6 January 2000
808 pages, 365 halftones & line illus., 234x156 mm
Series: International Union of Crystallography Monographs on Crystallography number 10
Search for titles in the same series

Ordering

Individual customers may:
order by phone, post, or fax.
Manufactured on Demand - stock will be supplied on a firm sale basis within 28 days

Teachers in UK and European schools (and FE colleges in the UK):

order by phone, post, or fax

Reviews

''This book reviews the state of the art for determining the "real" structure of matter' Zeitschrift Fur kristallographie' -

Description

Up-to-date summary of this field.
Topic is the principal limitation to the advance of Materials Science.
Information on residual stress and crystallite size analysis presented in a tutorial manner by the world's experts.
Over 340 illustrations.

Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With the advent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles to broaden and sometimes to become asymmetric. Thus, information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.

Readership: Main: Practitioners of X-Ray Analysis, X-Ray Crystallographers, Materials Characterization. Other: Postgraduates and Researchers in Materials Science and Engineering.

Contents

List of contributors

Abbreviations

1. Introduction to defect and microstructure analysis or the analysis of real structure , Jaroslav Fiala and Robert L. Snyder

Part I. Fundamentals of defect analysis by diffraction

2. Some applications of the kinematical theory of X-ray diffraction , Hans Bradaczek

3. Profile fitting and analytical functions , Stefano Enzo and Liliana Schiffini

4. Effects of instrument function, crystallite size, and strain on reflection profiles , V. Honkimäki and P. Suortti

5. Use of pattern decomposition or simulation to study microstructure: theoretical considerations , J. Ian Langford

6. Classical treatment of line profiles influenced by strain, small size, and stacking faults , C. R. Houska and R. Kuzel

7. Voigt function model in diffraction-line broadening analysis , Davor Balzar

8. X-ray analysis of precipitation-related crystals with dislocation substructure , R. I. Barabash

9. Analytic functions describing line profiles influenced by size distribution, strain, and stacking faults , C. R. Houska and R. Kuzel

10. The dislocation-based model of strain broadening in X-ray line profile analysis , T. Ungár

11. Diffraction-line broadening analysis of dislocation configurations , A. C. Vermeulen et al.

12. Diffraction-line broadening analysis of strain fields in crystalline solids , J. G. M. van Berkum et al.

13. Paracrystallinity , Hans Bradaczek

14. The model of the paracrystal and its application to polymers , W. Wilke

15. Effect of planar defects in crystals on the position of powder diffraction lines , A. I. Ustinov

16. Effect of stacking disorder on the profile of the powder diffraction line , Z. Weiss and P. Capková

Part II. Experimental techniques

17. Crystallite statistics and accuracy in powder diffraction intensity measurements , Deane K. Smith

18. Reciprocal space mapping and ultra-high resolution diffraction of polycrystalline materials , Paul F. Fewster and Norman L. Andrew

Part III. Macrostress

19. X-Ray analysis of the inhomogenous stress state , I. Kraus and N. Ganev

Part IV. Texture

20. Texture and structure of polycrystals , Hans J. Bunge

21. Texture effects in powder diffraction and their correction by simple empirical functions , V. Valvoda

Part V. Whole-pattern fitting

22. Accounting for size and microstrain in whole-powder pattern fitting , A. Le Bail

23. Modelling of texture in whole-pattern fitting , Matti Järvinen

24. A new whole-powder pattern-fitting approach , P. Scardi

25. The role of whole-pattern databases in materials science , Deane K. Smith

Part VI. Restoring physical patterns from the observed variables

26. Restoration and preprocessing of physical profiles from measured data , Marian Cernansky

27. Towards higher resolution: a mathematical approach , Derk Reefman

Part VII. Applications

28. Use of pattern decomposition to study microstructure: practical aspects and applications , Daniel Louër

29. X-ray diffraction broadening effects in materials characterization , Giora Kimmel and David Dayan

30. Crystal size and distortion parameters in fibres using Wide-Angle X-ray Scattering (WAXS) , R. Somashekar

31. Pressure-induced profile change of energy-dispersive diffraction using synchrotron radiation , Takamitsu Yamanaka

Index

Authors, editors, and contributors

Robert L. Snyder, Department of Materials Science and Engineering, The Ohio State University,
Jaroslav Fiala, Department of Metallurgy, Central Research Institute Skoda, and
Hans J. Bunge, Department of Physical Metallurgy, Technical University of Clausthal

Links to web resources and related information

More in the same subject area:
Crystallography

The specification in this catalogue, including without limitation price, format, extent, number of illustrations, and month of publication, was as accurate as possible at the time the catalogue was compiled. Occasionally, due to the nature of some contractual restrictions, we are unable to ship a specific product to a particular territory. Jacket images are provisional and liable to change before publication.